Division
We are good at what others can't do-
AIO3200
AIO 3200 is a wafer test system to test in the memory devices on wafer. This system uses a probe station for wafer handling and uses a probe card for interface. Thus, this system can offer the DC and AC test functionality like the Open, Short, measure the power supply current and DC bias pins, and available wafer test easily -
AIO700
As preexisting DC-only Testers only measure Static DC, they cannot initialize device while running Power Up Sequence or Pattern or measure current after entering certain mode. Thus, they have high possibility of Burn-Out or Over Kill in Burn-In.
AIO700 Functional DC Test System is a system developed to solve these problems and perform DC and Function Test during Sorter Index Time to screen DC and Function Fail Device in early states to minimize loss of processes. -
AIO570
As preexisting DC-only Testers only measure Static DC, they cannot initialize device while running Power Up Sequence or Pattern or measure current after entering certain mode. Thus, they have high possibility of Burn-Out or Over Kill in Burn-In. AIO570 Functional DC Test System is a system developed to solve these problems and perform DC and Function Test during Sorter Index Time to screen DC and Function Fail Device in early states to minimize loss of processes. -
TFS500A
As preexisting DC-only Testers only measure Static DC, they cannot initialize device while running Power Up Sequence or Pattern or measure current after entering certain mode. Thus, they have high possibility of Burn-Out or Over Kill in Burn-In. TFS500A Functional DC Test System is a system developed to solve these problems and perform DC and Function Test during Sorter Index Time to screen DC and Function Fail Device in early states to minimize loss of processes.
