AIO570

由于现有的直流测试仪只能测量静态直流，因此无法在运行上电顺序或模式时初始化设备，也无法在进入特定模式后测量电流。因此，他们在Burn-In中有很高的Burn-Out或overkill的可能性。
AIO570功能直流测试系统是为解决这些问题而开发的系统，并在分选索引时间内执行直流和功能测试，以筛选早期状态的直流和功能故障设备，以尽量减少过程损失。

SYSTEM SPECIFICATION


  • Compatible with new Devices (DDR3,LPDDR3,GDDR5,NAND Flash, eMMCetc)
  • 16 DUT Test System ( 40 Clock, 32 Address ,72 IO )
  • Increased Clock Pins and PPS Pins per DUT
  • Decrease in Test Time with Multi PMu on each DUT
  • High Speed Controller
  • New High Speed interface (with PCI interface)
  • New PG Board (40MHz)
  • Increased Pattem Depth(2K)
  • Increase in number of Time set(128)
  • PPS 6EA(PS1,2:800mA,PS3,4,5,6:200mA)
  • Improved maintenance with the power detached from PC and System
  • Improved flexibility in Device Program with Text Type Compiler