TDBI系统是内存(DRAM，闪存)测试老化系统，使用双捕获Ram和智能故障捕获Ram结构/算法最大限度地减少了测试时间，并消除了故障块进程限制。它具有高测试能力，除Flash Memory外，还适用于SRAM、DDR、RDRAM。TDBI系统的运行由一个微机控制的高速老化驱动系统提供，该驱动系统采用基于Linux的UFO图形软件。
SYSTEM SPECIFICATION
| Speed | 33MHz | ||
|---|---|---|---|
| PG | Type | ALPG | |
| Cycle Rate | 30ns~10.24uS | ||
| Cycle Resolution | 5ns | ||
| TG | User Clock | 16 | |
| No.of Timing Set | 128 | ||
| ADD.& Data Generator | Add. Generator | 24X,24Y,4X | |
| Data Generator | 18bits | ||
| Channel Q'ty | No. of Clock | 8ch / BIB | |
| No. of address | 32ch x 2 / BIB | ||
| No. of I/O | 72ch / BIB | ||
| PS | Current Range | PS1,2(50A-Force, Sense)PS3 (18A-Force, Sense) | |
CHAMBER SPECIFICATION
- 2 Slot /8 Zone/2 Chamber System
- Dimension:2800(w)x1750(D)x2270(H)mm
- Weight : Approx .3.000Kg
- Temperature & Air Flow
Temperature :-40'C~+140'C
Uniformity : +3°C
Ramp Up/Down :-40'C~+25'C/60min
Door Type : Manual
Board In/Out : Manual - Burn-in Board
BIB Size:450 x570mm
BIB ID Read : 4x8 Diode Matrix - Power Utility
Power Condition:220VAC,3Phase,60Hz,WYE