由于现有的直流测试仪只能测量静态直流，因此无法在运行上电顺序或模式时初始化设备，也无法在进入特定模式后测量电流。因此，他们在Burn-In中有很高的Burn-Out或overkill的可能性。 AIO560功能直流测试系统是为解决这些问题而开发的系统，并在分选索引时间内执行直流和功能测试，以筛选早期状态的直流和功能故障设备，以尽量减少过程损失。

SYSTEM SPECIFICATION

• Compatible with new Devices (DDR3,LPDDR3,GDDR5,NAND Flash, eMMCetc)
• 16 DUT Test System
• Increased Clock Pins and PPS Pins per DUT
• Decrease in Test Time with Multi PMu on each DUT
• High Speed Controller
• New High Speed interface (with PCI interface)
• New PG Board (20MHz, 8X/8Y/4Data Register)
• Increased Pattem Depth
• Increase in number of Time set
• Improved maintenance with the power detached from PC and System
• Improved flexibility in Device Program with Text Type Compiler